Emissivity measurements on Ti-6Al-4V

E. Risueño1, L. González-Fernández2,3, R. Pérez-Sáez1,2, L. del Campo4 and M. Tello1, 2

1Instituto de Síntesis y Estudio de Materiales, Universidad del País Vasco, Bilbao, Spain
2Departamento de Física de la Materia Condensada, Facultad de Ciencia y Tecnología, Universidad del País Vasco, Bizkaia, Spain
3Industria de Turbo Propulsores, S.A., Zamudio, Bizkaia, Spain
4Departamento de Física Aplicada II, Facultad de Ciencia y Tecnología, Universidad del País Vasco, Bizkaia, Spain

Keywords: FTIR
property: normal spectral emissivity
material: Ti-6Al-4V

Due to their high mechanical strength and corrosion resistance, titanium alloys are widely used in diverse industrial fields, ranging from aeronautical industry to medical engineering, automobile production or tooling. Alloys with different components and thermomechanical treatments are employed to enhance these interesting properties. The most used alloy is Ti-6Al-4V, which covers more than the 50% of the technological applications, for several of which, the knowledge of the radiative properties of this alloy can be very helpful. However, these experimental data are missing in the literature.

In this work, the normal spectral emissivity of Ti-6Al-4V is characterized between 2 and 22 µm. Both the temperature dependence of emissivity between 250-850 ºC and its evolution with the thermal cycling are studied. All the measurements are carried out by means of a highly accurate home made radiometer [1] equipped with a FT-IR spectrometer (Bruker IFS66v/S) in a protective atmosphere to prevent oxidation. The measurement method and the calibration process are described in ref [2]. The results show a strong decrease of the emissivity at around 550 ºC during the first thermal cycle, whereas during the next cycles a weak continuous increase of the emissivity is observed for all the spectral range. Time evolution of the emissivity during isothermal measurements is also studied. The microstructure of the as-received and after-emissivity-measurements samples is characterized by using X-ray diffraction and electronic microscopy.

  1. L. del Campo, R.B. Pérez-Sáez, X. Esquisabel, I. Fernández, M.J. Tello, Rev. Sci. Instrum. 77, 113111 (2006)

  2. L. González-Fernández, R. B. Pérez-Sáez, L. del Campo, M. J. Tello, Appl. Opt. 49, 2728 (2010)

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