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PostHeaderIconDetailed Program


WEDNESDAY 31st AUGUST 2011
'N. Germanos' Conference Center
11:20 - 13:00

Photothermal Techniques 2
Hall C
11:20Development of photothermal reflectance method for evaluating thermal contact resistance in SiP-mounted semiconductor devices (Three-dimensional heat conduction model for micro-scale sample configuration)
Y. Otsubo1, Y. Taguchi2 and Y. Nagasaka2
1School of Integrated Design Engineering, Keio University, Japan
2Department of System Design Engineering, Keio University, Japan
11:40Simultaneous measurement of thermal diffusivity and optical absorption coefficient of homogeneous solids using photothermal radiometry
R. Fuente1, E. Apiñaniz1, A. Mendioroz1 and A. Salazar1
1Fisika Aplikatua I Saila, Euskal Herriko Unibertsitatea, Spain
12:00Thermal and optical characterization of multilayered solids using photothermal radiometry
R. Fuente1, E. Apiñaniz1, A. Mendioroz1, R. Celorrio2 and A. Salazar1
1Departamento Fisica Aplicada I, Escuela Tecnica Superior de Ingenieria, Universidad del Pais Vasco, Spain
2Departamento de Matemática Aplicada, Universidad de Zaragoza, Zaragoza, Spain
12:20Temperature dependent thermal properties of thin films up to high temperatures – pulsed photothermal radiometry measurement system and Si-B-C-N films
J. Martan1, J. Čapek1 and E. Amin Chalhoub1
1Department of Physics, University of West Bohemia, Plzeň, Czech Republic
12:40Measurement of thermal diffusivity and thermal effusivity of thick solids by photoacoustic technique
A. Yoshida1, A. Imuta1 and T. Yamada1
1Osaka Prefecture University, Japan

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